eeFILM – Extended Excitation for Faster Measurement of Fluorescent Lifetimes
Sensors, Devices and Components
Here we provide an improved emission lifetime measuring method and apparatus, avoiding dis- advantages of conventional techniques. The basic concept is to replace the very narrow conventional excitation pulses by a pulse en- compassing a constant plateau section longer than the longest excited state lifetime in the sample (s. fig. 1). Thus the sample achieves an equilibrium excited steady-state showing a constant fluorescence intensity.
Integration of the fluorescence signal leads to a detector response function including a linear response section (s. fig. 2). This section is characterized by an intercept on the temporal axis with a displace- ment corresponding to the mean fluorescence lifetime. Since this value can be directly derived by means of only two points and a linear equation, the calculations for FLIM imaging are drastically simplified, thereby not only accelerating image capture but also allowing real-time imaging of complex biological or physical processes.
- Longer excitation pulses have much higher intensity and energy and are easier and cheaper to generate
- Broad range of samples can be investigated: solid, liquid and gaseous samples with single or multiple electronic transitions
- Measurements in a broad time range covering fluorescence or phosphorescence
- Detection of very short lifetimes with high sensitivity and photon efficiency
- Any detector (single, array, camera) incorporating a suitable gating feature is feasible
- Enhanced signal-to-noise ratio
- Fast signal processing and reduced complexity of algorithms in signal processing
- Compatible with TCSPC technology
EP patent application filed in January 2016.
- Ref.-No.: 0707-5026-BC (239.8 KiB)
Dr. Bernd Ctortecka, M. Phil.
Phone: +49 89 / 29 09 19-20